documents: EPA-HQ-OAR-2011-0028-0105

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id agency_id docket_id title document_type subtype posted_date posted_year posted_month comment_start_date comment_end_date last_modified fr_doc_num open_for_comment withdrawn object_id
EPA-HQ-OAR-2011-0028-0105 EPA EPA-HQ-OAR-2011-0028 Final Technical Documentation - Revision of Default Utilization Rates and By-Product Formation Rates; Revision of Default Destruction and Removal Efficiencies for Semiconductor Facilities under Subpart I; and Revision of Maximum Field Detection Limits for the Stack Test Method Supporting & Related Material Technical Support Document 2013-08-19T04:00:00Z 2013 8     2013-08-19T20:13:22Z   0 0 09000064813b8d3d

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